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Webinar

Overcoming iToF Challenges: Enabling Precision Depth Sensing for Industrial and Commercial Innovation

ET
60 Minutes

Depth information is becoming increasingly valuable across a wide range of applications. Currently, Indirect Time-of-Flight (iToF) sensors use traditional image sensor techniques combined with phased lighting to determine depth. While these sensors offer higher resolution compared to direct Time-of-Flight (dToF) sensors, they have drawbacks in distance, noise, obstructions, object movement, and data-intensive processing. 

Join us for this insightful webinar to learn how to address today’s key obstacles. We’ll take an exciting look at the latest innovations and explore:

  • Limitations to current iToF sensors, and how to overcome them
  • The importance of depth sensing in a variety of applications
  • The latest sensors offering innovative iToF technology
  • How to enable the adoption of iToF within traditional factory inspection lines, robotics, scanning, and many other use cases
  • And more 

Speakers

onsemi

David Mills

Business Development Manager, EMEA Intelligent Sensing Group
onsemi ‎

David is the EMEA Business Development Manager for the Intelligent Sensing Group at onsemi, joining through the Truesense Imaging acquisition, he started with the Kodak image sensor business in 2003.

David’s responsibilities include the handling of a large image sensor portfolio, spanning hugely diversified markets, from high performance image sensors for the industrial market through to advanced image sensors deployed in commercial applications; and much more in between.

David has been in high-end OEM semiconductor sales and business development for over 30 years, including positions at Philips Semiconductor, Integrated Device Technology and 8x8, since graduating from Brunel University, England with a BSc(Hons) in Electrical & Electronic Engineering. 

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