Zzzzappp!

When someone with a static charge buildup touches an electronic device the damages to the IC are not difficult to detect. It's the secondary ESD effects that are hard to troubleshoot because they might not hit the IC. At least not right away. Researchers at the University of Missouri-Rolla (www.emclab.umr.edu) have developed a scanning probe that can pinpoint the affected area on a PCB. (www.sensorsmag.com/0906/RDESD)



Suggested Articles

OmniVision's new OX01F10 SoC module provides automotive designers with a small form factor with low-light performance, ultra-low power and reduced cost.

Several industry leaders have formed a QSFP-DD800 Multi-Source Agreement (MSA) Group to expedite development of high-speed, double-density, quad small form…

NXP Semiconductors N.V. has announced its secure fine ranging chipset, SR100T, to achieve precise positioning performance for next-generation UWB-enabled…