XJTAG has generated significant updates in XJTAG v3.8. For example, Waveform Viewer is now available in XJ Developer, the layout viewer is entirely replaced, and test coverage analysis algorithms have been improved. The newt version is said to offer smarter debugging, a smoother programming experience, and better test coverage analysis. There is more control over how data is viewed, as details behind logic block operation and recorded pin data are more visible.
Other enhancements include:
- Visually targeted debugging with Waveform Viewer. While Waveform Viewer has previously given insight into circuit behavior in XJ Analyser, it is now available with XJ Developer, for an improved debugging experience.
- A smoother Layout Viewer experience with faster load times. Project files can be opened quicker and navigation is smoother. Visual resolution is sharper.
- Test coverage can be better understood as it is tracked back to its source more accurately. XJ Developer now shows the direct impact of enabling or disabling one or more tests. The current test coverage of a project can be compared with its potential test coverage. Therefore, it is possible to find out where coverage may need to be extended, which is critical information for achieving the best test coverage.
- Anew feature is XJTAG’s ability to assess defect coverage using the PCOLA/SOQ industry-standard approach to reporting.
For further information, visit XJTAG.