NanoCalc systems from Ocean Optics Inc., Dunedin, FL, use spectroscopic reflectometry to determine optical thin-film thicknesses for consumer, semiconductor, medical, and industrial applications. The systems are offered with a range of wavelength, sampling method, and optical-layer-thickness requirements (1.0 nm to 250 µm) and in four standard models between ~200–1700 nm. You can combine them with software, reflection probes, optical fibers, and various accessories. For applications in the visible (400–850 nm) or UV-visible (250–1050 nm) range, you can select preconfigured systems that combine the NanoCalc, a reflection probe and sampling stage, a calibrated Si-SiO2 five-step reference wafer, and software that analyzes up to 10 optical layers.
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