Test System Accelerates Passive Component Characterization

EXFO unveils what it is calling the fastest test system for insertion loss (IL) and return loss (RL) measurement for a wide variety of passive components, including photonics integrated circuits. Integrating technology from the recently acquired Yenista Optics, the system can be used by research scientists to extensively characterize components or in automated mode for high volume production. It is capable of measuring IL and RL in a single sweep up to 1000 nm/s. For more details, visit EXFO.

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