Tektronix Releases MHL 3.0 Advanced Analysis and Compliance Test Solution

BEAVERTON, OR -- Tektronix, Inc. releases an advanced analysis and compliance test solution for the latest Mobile High-Definition Link (MHL) standard. The new MHL 3.0 solution supports the latest MHL Compliance Test Specification, CTS 3.2, and provides complete support for validating source, sink and dongle devices across all three data rates: 6 Gbps, 3 Gbps and 1.5 Gbps.

The MHL 3.0/CTS 3.2 standard supports 4K (UHD), HD video and 7.1 surround-sound audio while simultaneously charging the connected device. There are now more than 400 million MHL products in use by consumers, developed by the growing base of more than 200 global adopter companies. MHL-enabled products include adapters, automotive accessories, AV receivers, Blu-ray Disc players, cables, DTVs, media sticks, monitors, projectors, smartphones, tablets, TV accessories, and more. As an active contributor, Tektronix has offered a comprehensive set of automated PHY and protocol layer test solutions since the first MHL specification was released in 2010.

"As an important mobile industry standard, MHL is evolving rapidly with new features and new test strategies for transmitter input and receiver output test points," said Brian Reich, general manager Performance Oscilloscopes, Tektronix. "We are continuing to offer customers developing MHL products important advantages such as simpler test setup for faster test cycles and more comprehensive test coverage including industry proven direct synthesis based receiver test solutions and backward compatibility testing."

The new Opt. MHD3 software for use with Tektronix DPO/MSO70000 oscilloscopes supports the full range of MHL transmitter and receiver electrical tests. It provides backward compatibility testing with MHL 2.1 and 1.X (available in Opt. MHD) and supports MHL 3.0/CTS 3.2 source/sink and dongle devices.

The full solution provides faster execution for the full range of tests outlined in CTS 3.2 through the use of optimized algorithms that ensure all algorithm tests are performed in matter of minutes. An additional advantage is TMDS and eCBUS eye-diagram support with auto-mask fit for easy debugging and automatic mask adjustment. The solution also enables customers to perform BER test with calibrated patterns for Transmitter Input test. The Auto calibration module generates the required calibrated patterns based on the Jitter from DUT signals.

Setup is simplified through the use of connection diagram screenshot pop-ups during execution that have been proven to help reduce setup mistakes. The solution also offers complete programmatic interface support for integrating the MHL 3.0/CTS 3.2 test solution into users' test environments. Elaborate reporting options with user-selectable fields and formats for report customization are also available.

"The MHL standard continues to grow and with over 200 adopters and an installed base of more than 260 million products from many of the world's leading consumer and mobile device companies, advanced testing solutions are vital to ensure interoperability across compatible devices," said Solomon Langley, vice president, Lattice Semiconductor. "The ongoing collaboration we have with Tektronix ensures that consumer and mobile device manufacturers have proven test resources that will help them bring fully compliant MHL 3.0 devices to market quickly."

Pricing & Availability
The completely automated Opt MHD3 solution for MHL3.0/CTS3.2 is available now. Pricing starts at $10,000 US MSRP.

For additional information go to http://www.tek.com/technology/mhl
 

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