SWIR Detector from Xenics

Click for larger image
Xenics

Xenics, Leuven, Belgium, offers the XFPA-1.7-640-LN2 low-noise SWIR detector for demanding low-signal-level measurements in semiconductor inspection and fault localization. The liquid-nitrogen-cooled detector was developed for R&D spectroscopy and photon emission in the semiconductor failure analysis industry, high-resolution spectroscopy, and low-light-level SWIR and VisNIR imaging. The detector is based on source-follower detector read-out technology and offers a 640 by 512 pixel resolution with a 20 µ pixel pitch for long integration times. Liquid nitrogen cooling at 77 K lets the detector achieve noise <20 e- and dark current <5 e-/s/pixel.

Contact Info

Company: Xenics
Country: Belgium
Phone number: +32 16-38-99-00
Fax: +32 16-38-99-01

Suggested Articles

QuickLogic Corporation and Nuance Communications are partnering to deliver low power wake word and voice command technology for power-sensitive applications,…

New Apple Watch and larger iPad also on tap

The technology and business issues of hybrid and electric vehicles will be open for debate at the Electric and Hybrid Vehicle Technology Expo and Battery Show…