Surface Imaging And Metrology Software Takes On A Plethora Of Chores

Surface Imaging And Metrology Software Takes On A Plethora Of Chores

NanoMap Alpha is now integrated into the company’s NV- and NVM-series 3D optical measurement systems, providing a versatile tool for analyzing semiconductors, PCBs, displays, engineered parts, chemical materials, and optical parts. Reportedly easy to use, the app provides a user-friendly ribbon interface and contextual tabs with intuitive icon-based tools
Analysis routines can be saved as templates and re-applied to batches for eport generation.
Each analysis step can be fine-tuned at any time as all dependent steps are automatically recalculated. Additionally, the software is in compliance with the ISO and national standards:

Digital Surf
Besançon, France
+33 38150 4800
[email protected]
[email protected]
[email protected]
http://www.digitalsurf.com

NanoSystem
ChongQing, China
+86-157-3012-8229
http://nanosystemz.com

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