NanoMap Alpha is now integrated into the company’s NV- and NVM-series 3D optical measurement systems, providing a versatile tool for analyzing semiconductors, PCBs, displays, engineered parts, chemical materials, and optical parts. Reportedly easy to use, the app provides a user-friendly ribbon interface and contextual tabs with intuitive icon-based tools
Analysis routines can be saved as templates and re-applied to batches for eport generation.
Each analysis step can be fine-tuned at any time as all dependent steps are automatically recalculated. Additionally, the software is in compliance with the ISO and national standards: