ATE-Connect Test Technology Speeds Silicon Debug

Mentor’s ATE-Connect technology in its Tessent SiliconInsight product for IC debug and bring-up creates an industry-standard interface to eliminate communication barriers between proprietary, tester-specific software and design-for-test (DFT) platforms. It accelerates debug of IJTAG devices, accelerates product ramps, and reduces time-to-market for products in 5G wireless communications, autonomous driving, and artificial intelligence. Mentor also announces that Teradyne's UltraFLEX test solution supports the latest Mentor interface through its PortBridge technology.


Using the TCP/IP network protocol, ATE-Connect technology provides IJTAG commands to the device under test and receives data from the device on the ATE, while keeping the sensitive design information in the realm of the Tessent SiliconInsight tool and only providing the required stimulus to the device under test on the ATE. With this standard network communication, users can leverage their existing secure networks to enable seamless interaction with testers around the globe. For more details, visit the ATE-Connect technology page.

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