National Instruments has launched a hardware-accelerated 5G mmWave OTA Validation Test reference architecture to characterize and validate 5G mmWave beamforming AiP devices, enabling designers to speed development of 5G systems.
The architecture achieves fast speeds for OTA spatial sweeps in the 5G mmWave bands from 24 to 44 GHz, helping users significantly reduce OTA RF validation test times for AiP devices, compared to traditional point-by-point, software-controlled test systems. This architecture gives engineers working on the latest 5G AiP devices the advantage of addressing their devices’ beamforming performance with wider, more complex 5G NR signals while shortening development schedules. The fast OTA test approach helps engineers use denser spatial grids and obtain finer 3D spatial resolution while keeping test times low.
Designers can use the company’s mmWave OTA Validation Test Software to quickly configure these extensive spatial sweeps to characterize their device’s antenna patterns as they produce, visualize, store or distribute detailed parametric results.
The OTA Validation Test reference architecture includes NI’s mmWave VST for wideband RF signal generation and measurement, PXI instruments for repeatable and precise motion control, an isolated RF chamber for true far-field radiated testing in a quiet environment, and the mmWave OTA Validation Test Software for interactive use and automation.
This solution complements NI’s modular instrumentation portfolio and measurement software to characterize and validate the latest 5G RFIC devices, from sub-6 GHz to mmWave.