Two Heads Better Than One In Open Architecture Probing Station

Huntron’s Access DH2 (Dual Head) Open Architecture Probing Station is a dual head Robotic Flying Probe system that is best suited for low volume printed circuit assembly (PCA) testing where interfacing between two points is necessary. The Access DH2 can be used with traditional Huntron Tracker products or configured to work with Functional and Parametric test and measurement instruments. The Access DH2 features built-in side by side 19" racks that provide ample space for PC and integrated test instrumentation for a plug-and-play approach to automating manual guided probe applications.

 

The system provides a clear path to increased productivity and printed circuit card asset recovery ensuring a cost-effective approach to shorten repair cycles and enhance conventional test procedures. The benefits are recovery of previously unrepairable PCAs, support of legacy products that have limited or no documentation and diagnosing fallout from functional test. For more details, checkout the Access DH2 brochure.

Sponsored by Anritsu Company

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