BEAVERTON, OR – Tektronix, Inc. introduces the Keithley S540 Power Semiconductor Test System, a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV. Optimized for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high voltage, low voltage, and capacitance tests in a single probe touch-down.
As demand for power semiconductor devices continues to increase and as SiC and GaN are becoming more commercialized, manufacturers are adopting wafer-level testing in their production processes to optimize yields and improve profitability. For these applications, the S540 lowers cost of ownership by minimizing test time, test set-up time, and floor space while achieving lab-grade high voltage measurement performance.
To deliver production-level performance, the S540 can perform parametric measurements on up to 48 pins without changing cables or probe card infrastructure. It can also perform transistor capacitance measurements such as Ciss, Coss, and Crss up to 3kV, again without manual reconfiguration of test pins. Further boosting test output, the S540 offers sub-pA measurement performance and can perform fully automated, high voltage leakage current tests in <1 sec.
As a standard commercial product, the S540 offers fully traceable system specifications, safety compliance, diagnostics, and worldwide service and support, features that are often missing in home-built or custom systems. The S540 draws on Keithley’s 30+ years of semiconductor parametric testing expertise and safely and seamlessly integrates industry-leading semiconductor test instrumentation with both low- and high-voltage switching matrices, cabling, probe card adapters, prober drivers, and test software.
Pricing & Availability
The Keithley S540 is available for order now with delivery beginning in March, 2017. For more information go to http://www.tek.com/keithley-s540-parametric-test-system