Roughness Sensor Boosts Measuring Efficiency

The ZEISS ROTOS roughness sensor enables the use of coordinate measuring machines to completely inspect surface waviness and roughness, even on complex workpieces, and all in a single measurement run without any reclamping. The sensor makes it is possible to check the size, form, and location tolerances together with the roughness parameters on a single machine. Instead of requiring separate stylus instruments to capture more significant form deviations, these can now be performed on ZEISS PRISMO and ZEISS CenterMax CMMs. The sensor can be exchanged in as needed using an interface on the CMM probe. Depending on the measuring machine and the particular stylus, you can capture Ra roughness values of up to 0.03 µm.

 

The design of the ZEISS ROTOS enables the inspection of nearly all workpiece characteristics. Via the three rotatable, multiple stylus arms, it is also possible to measure deep boreholes and difficult-to-reach surfaces. Features also include skidless styli intended for measuring roughness and waviness on sealing faces.

Sponsored by Anritsu Company

New VNA technologies enable mmWave broadband testing to 220 GHz, helping researchers and engineers to overcome test challenges and simplify mmWave testing.

Application development in the mmWave frequencies is growing. Broadband testing over hundreds of GHz of bandwidth is subject to repeatability/accuracy deficits, and engineers demand solutions to help overcome challenges and simplify mmWave testing.

 

For more information visit the ZEISS ROTOS page. Further information is also available from the ZEISS Group.

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