Moortec unveils what it calls an easy to integrate, high accuracy, embedded monitoring subsystem on TSMC’s 12nm FinFET Compact process technology (FFC). Moortec’s Process, Voltage and Temperature (PVT) monitoring IP is designed to optimize performance in today’s cutting-edge technologies, solving the problems that come about through scaling of devices. Applications include Datacenter & Enterprise, Automotive, AI, Mobile, IoT, Consumer and Telecommunications.
Within the new 12nm subsystem the Process Monitor provides the means for advanced node Integrated Circuit (IC) developers to detect the process variation of 12nm core digital MOS devices. The Process Monitor can also be used to enable continuous Dynamic Frequency and Voltage Scaling (DVFS) optimization systems, monitor manufacturing variability across chip, gate delay measurements, critical path analysis, critical voltage analysis and monitor silicon ‘ageing’.
The subsystem also includes a Voltage Monitor which is a low power self-contained IP block specially designed to monitor voltage levels within the core logic voltage domains and provide accurate IR drop analysis. The measurement range is customized to suit each technology. The monitor IP can also monitor analog (IO) supply domains and is also well-suited to monitoring supply droops and perturbations.
To complete the system there is a high precision low power junction temperature sensor, which has been developed to be embedded into ASIC designs. It can be used for many different applications including DVFS, device lifetime enhancement, device characterization and thermal
profiling. The package includes a sophisticated PVT Controller with AMBA APB interfacing, which supports multiple monitor instances, statistics gathering, a production test access port as well as other compelling features.
In-chip monitoring has become a vital factor in the design and performance optimization of small-geometry designs. Since 2010 Moortec have brought to market a highly featured embedded in-chip PVT sensing fabric for use within advanced node CMOS technologies from
40 nm down to 7 nm.
The package includes a sophisticated PVT Controller with AMBA APB interfacing, which supports multiple monitor instances, statistics gathering, a production test access port as well as other compelling features. In-chip monitoring has become a vital factor in the design and performance optimization of small-geometry designs. Since 2010 Moortec have brought to market a highly featured embedded in-chip PVT sensing fabric for use within advanced node CMOS technologies from 40 nm down to 7 nm.
For more Moortec, visit Moortec Semiconductor Ltd, and/or email your queries and concerns to [email protected], and/or just hop on the phone and call the company at +44 1752 875 130.