Optical Pen Handles High-Res Measurements

Optical Pen Handles High-Res Measurements

STIL’s latest optical pen, the CL0-MG210, is capable of performing high-resolution measurements from MEMs to microbumps and nano-roughness. The component specifies a depth of field of 70 µm, working distance of 2.6 mm, an NA of 0.67, axial resolution of 5 nm, and a lateral resolution of 0.9 µm. For further information, visit http://www.stilsa.com.

STIL
Cedex, France. +33 (0)4.42.39.66.51
[email protected]
http://www.stilsa.com 
 

Suggested Articles

RaayonNova founder and CEO Aleksandr Shtukater is developing advanced contact lens technology that can potentially replace smartphones and tablets.

Analyst firm Omdia reverses earlier upbeat projection for smartphone growth in China due to virus impact on supplies like displays

Japanese e-commerce company MoDeCH is offering a complete online library of vendor-supplied and proprietary SPICE simulation models.