Microsemi Corporation will be participating in the Radiation Effects on Components & Systems Conference (RADECS) , held in Bremen, Germany Sept. 19-23, 2016.
Microsemi Corporation will be participating in the Radiation Effects on Components & Systems Conference (RADECS) , held in Bremen, Germany Sept. 19-23, 2016. Microsemi experts will share their expertise in a paper titled, "Total Dose and Single Event Effects Hardening and Testing on the LX7730 Mixed Signal Telemetry Controller," which will explore both total dose and single event effects hardening and testing of the company's first radiation-hardened analog mixed-signal telemetry controller integrated circuit (IC), the LX7730. In addition, Microsemi experts will present their paper titled, "Single Effects Hardening on 65 nm Flash-Based Field Programmable Gate Array," which will address single event effects and the company's first radiation-hardened Flash-based field programmable gate array, the RTG4.
Microsemi will also be showcasing its LX7730, LX7720 and RTG4 devices at booth #23 at the conference.
The aim of RADECS is to provide an annual European forum for the presentation and discussion of the latest advances in the field of radiation effects on electronic and photonic materials, devices, circuits, sensors and systems. The scope of the conference encompasses technological processes and design techniques for producing radiation-tolerant systems for space, aeronautical or terrestrial applications, as well as relevant methodologies for their characterization and qualification.
Microsemi will be located in booth #23 at RADECS, which is being held at the Congress Centre Bremen, located at Findorffstraβe 101 in Bremen, Germany.
Microsemi's "Single Event Effects Hardening on 65nm Flash-based FPGA" and "Total Dose and Single Event Effects Hardening and Testing on the LX7730 Mixed Signal Telemetry Controller" papers will be presented during the Data Workshop segment of the conference on Thursday, Sept. 22 from 2:35-4:30 p.m. local time.
RADECS is regarded as one of the key events on radiation effects related to components, integrated circuits and electronic devices. Participants of RADECS are primarily engineers, scientists, managers, students and exhibitors.
Learn more at http://www.microsemi.com