Marvin Test Solutions Brings New Capabilities to PXI-Based Semiconductor Test with TS-960

TS-960 Test Platform and GX5296 Module Provide New Digital Test Benchmarks

IRVINE, CA -- Marvin Test Solutions announces the TS-960, the newest version of its successful TS-900 PXI semiconductor test platform. The TS-960 brings the performance and features of high-end systems to customers at a fraction of the footprint and with outstanding value compared to traditional ATE.

"Our semiconductor customers asked for an alternative to big-iron ATE systems that would combine high-performance measurements with a substantially reduced footprint," said Steve Sargeant, CEO of Marvin Test Solutions. "By using the TS-960 platform and our new GX5296 digital subsystem, customers get a flexible PXI platform with high-performance timing features typically found only in high-end ATE systems."

Proven Test Platform

The TS-960 platform features a 20-slot, 3U PXI chassis accommodating up to 512 125 MHz digital I/O channels with PMUs per pin, yet has a small footprint and modular structure, allowing users to address a range of test applications. Available as a bench top, with an integrated cart, or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for device, SoC and SiP test applications.

High-Performance Digital Test

The GX5296 delivers high-performance digital test capabilities and is ideal for addressing verification, focused production, and failure analysis test needs - or for replacing legacy test systems. The GX5296 builds on the successful GX5295 digital subsystem with enhanced timing performance and features.

As the highest performing PXI card available today, the GX5296 leverages the features and capabilities of multiple Marvin Test Solutions products, delivering unrivaled timing, density, memory, and parametric measurement capabilities. The GX5296 occupies only a single PXI 3U slot, yet features flexible timing and high-resolution edge placement, providing no-compromise digital test capabilities as well as the flexibility to test and characterize a device's DC and AC performance.

GX5296 Key Features:
• 32, 125 MHz digital channels, PMU per pin
• Timing per pin with 1 ns edge placement
• 64 timing set groups
• 64 Mb/pin
• Data formatting (6 formats)
• -2 to +7 volt drive / sense range
• Full-featured sequencer with 16 loop counters
• Compatible with standard digital test file formats – VCD, eVCD, STIL, WGL

For more information, visit http://www.marvintest.com
 

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