Inspection Platform Offers Affordable High Resolution Nano-Scale Imaging

Park Systems’ Park NX12 embarks as an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities. It features an Inverted Optical Microscope (IOM) based SPM platform for SICM, SECM, and SECCM, in addition to Atomic Force Microscopy for research on a broad range of materials from organic to inorganic, transparent to opaque, soft to hard.

 

Park NX12 combines NX10 base with NX-Bio's XY stage that mounts on an inverted optical microscope and supports all of the available modes and options for NX10 with enhanced optics. The Inverted Optical Microscope (IOM) feature is designed to work with transparent samples using a pipette based technique and utilizes PinPoint™ mode in liquid for nanomechanical characterization.

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The platform also solves the challenges in material characterization for clean and renewable energy applications and sensors by providing enough resolution of existing SECM techniques for high resolution detection of interfacial transport and surface chemistry. It also has studious handling for the pipette probes used in SECM characterization and similarly transparent materials such as nanopore membranes (for fuel cells) and biomembranes (for sensors). For more details, go to http://www.parkafm.com

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