Event Spotlights RF Measurement Techniques

RF engineers, electrical engineers, network operators, and more will gain the latest education in cutting edge RF applications guidance, measurement tips and techniques, and hands-on demonstrations by attending Rohde & Schwarz’s RF LUMINATION 2019 event. The event will take place Thursday, Feb. 21, 2019; 8:00 AM to 4:00 PM, at the Biltmore Hotel & Suites, 2151 Laurelwood Rd., Santa Clara, CA. Attendance is limited and on a first-to-register basis.

 

Classes include:

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  • 5G mm-wave Chipset Characterization using On-wafer Loadpull
  • Advanced Techniques for Phase Noise and Jitter Measurements
  • Automated RF Component Test for Design Engineers without Programming
  • Controlling Phased Array Antennas
  • Digital Doherty Power Amplifiers
  • MISO Transmitters (Multiple Input, Single Output)
  • Residual (Additive) Phase Noise Measurements
  • Simplifying Wideband Multi-Antenna Applications with Advanced Data Converter Integration

 

For more info and registration details, visit RF LUMINATION 2019 .

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