EBSD Detector Integrates Advanced Sensors

Thermo Fisher Scientific’s Lumis electron backscatter diffraction (EBSD) detector for electron microscopy promises to quickly and accurately identify new materials and understand how the structure of a material affects its properties. The detector combines advanced optics with a unique sensor that collects more than 2.2 megapixels, allegedly the largest number of pixels of any EBSD detector on the market.

 

The detector employs a large-format CMOS sensor to enable higher sample throughput, higher resolution measurements and more precise phase identification, as compared to Thermo Fisher Scientific's previous-generation CCD detectors. The CMOS sensor provides reliable sensitivity at high frame rates due to a high dynamic range, increased quantum efficiency, and improved noise management.

Sponsored by Anritsu Company

New VNA technologies enable mmWave broadband testing to 220 GHz, helping researchers and engineers to overcome test challenges and simplify mmWave testing.

Application development in the mmWave frequencies is growing. Broadband testing over hundreds of GHz of bandwidth is subject to repeatability/accuracy deficits, and engineers demand solutions to help overcome challenges and simplify mmWave testing.

 

Users can identify crystallographic phases and grain properties, as well as monitor structural transformations in samples. The detector is also designed to help users better understand failure mechanisms. Learn more and detect more, checkout the Lumis EBSD datasheet.

Suggested Articles

AMD and Nvidia saw 6% drop, joining long list of losers

Interconnections supplier Amphenol Corp. has downgraded its Q1 2020 fiscal guidance due to coronavirus effects on its business.

New Ethos-U55 with Cortex-M is designed for industry and IoT edge