CMOS Image Sensor Enables High-Speed Machine Vision

Now in mass production, the CMV50000 CMOS image sensor from ams features a 35mm-format 7920 x 6004 array of 4.6µm-sized pixels based on a patented eight-transistor pixel architecture, is a breakthrough in CMOS image sensor performance. It operates at a fast 30 frames/s with 12-bit pixel depth at full resolution or a binned 4K and 8K modes, and even faster – up to 60 frames/s – with pixel sub-sampling at 4K resolution.

 

This means the CMV50000 can provide the detailed views of a large surface area that are required in factory automation applications such as automated optical inspection (AOI) equipment and systems for the inspection of displays of mobile phones, tablets, laptops and TVs. The combination of high frame rate and high resolution enables manufacturers to increase their already high throughput rates at consumer product assembly plants.

Sponsored by Anritsu Company

New VNA technologies enable mmWave broadband testing to 220 GHz, helping researchers and engineers to overcome test challenges and simplify mmWave testing.

Application development in the mmWave frequencies is growing. Broadband testing over hundreds of GHz of bandwidth is subject to repeatability/accuracy deficits, and engineers demand solutions to help overcome challenges and simplify mmWave testing.

 

The low-noise ams pixel architecture offers excellent electronic shutter efficiency, and the global shutter operation produces distortion-free images of fast-moving objects. The sensor offers 64dB optical dynamic range at full resolution and up to 68dB in binned 4K mode. The image sensor benefits from the implementation of sophisticated new on-chip noise-reduction circuitry such as black-level clamping, enabling it to capture high-quality images in low-light conditions. For more details, a datasheet is available.

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